LaueView Documentation



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  • Srajer V., Crosson S., Schmidt M., Key J., Schotte F., Anderson S., Perman B., Ren, Z., Teng T-.Y., Bourgeois D., Wulff M., and Moffat K.
    Extraction of Accurate Structure Factor Amplitudes from Laue Data: Wavelength Normalization with Wiggler and Undulator X-Ray Sources.
    J. Synchrotron Rad. 7: 236-244 (2000).
  • Ren Z., Bourgeois D., Helliwell J.R., Moffat K., Srajer V., and Stoddard B.L.
    Laue Crystallography: Coming of Age.
    J. Synchrotron Rad. 6: 891-917 (1999).
  • Yang X., Ren Z., and Moffat K.
    Structure Refinement Against Synchrotron Laue Data: Strategies for Data Collection and Reduction.
    Acta Cryst. D 54:367-77 (1998).
    abstract (HTML) and abstract (PDF)
  • Ren Z., Ng K., Borgstahl G.E.O., Getzoff E.D., and Moffat K.
    Quantitative Analysis of Time-Resolved Laue Diffraction Patterns.
    J. Appl. Cryst. 29:246-260 (1996).
  • Ren Z., and Moffat K.
    Deconvolution of Energy Overlaps in Laue Diffraction.
    J. Appl. Cryst. 28:482-493 (1995).
  • Ren Z., and Moffat K.
    Quantitative Analysis of Synchrotron Laue Diffraction Patterns in Macromolecular Crystallography.
    J. Appl. Cryst. 28:461-481 (1995).

*Copyright © 1991-2001 Zhong Ren, The University of Chicago.